Electron diffraction (LACBED) and HRTEM Moiré fringe pattern study of stress in YBaCuO thin film on Mg0

Publisher: Edp Sciences

E-ISSN: 1764-7177|10|PR6|Pr6-131-Pr6-135

ISSN: 1155-4339

Source: Le Journal de Physique IV, Vol.10, Iss.PR6, 2000-04, pp. : Pr6-131-Pr6-135

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next