ADVANTAGES OF ac-EBIC IN DETERMINING THE SEMICONDUCTOR PARAMETERS

Publisher： Edp Sciences

E-ISSN： 1764-7177|01|C6|C6-83-C6-88

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.01, Iss.C6, 1991-12, pp. : C6-83-C6-88

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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