Investigation on origins of residual stresses in Ni-NiO system by X-ray diffraction at high temperature

Publisher： Edp Sciences

E-ISSN： 1764-7177|03|C9|C9-987-C9-997

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.03, Iss.C9, 1993-12, pp. : C9-987-C9-997

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