Recent developments in X-ray projection microscopy and X-ray microtomography applied to materials science

E-ISSN： 1764-7177|03|C7|C7-2099-C7-2104

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.03, Iss.C7, 1993-11, pp. : C7-2099-C7-2104

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