A positron beam study of defects in SiO2

Publisher： Edp Sciences

E-ISSN： 1764-7177|03|C4|C4-169-C4-175

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.03, Iss.C4, 1993-09, pp. : C4-169-C4-175

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