

Publisher: Edp Sciences
E-ISSN: 1764-7177|04|C5|C5-11-C5-20
ISSN: 1155-4339
Source: Le Journal de Physique IV, Vol.04, Iss.C5, 1994-05, pp. : C5-11-C5-20
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content


TECHNOLOGIE D'AUJOURD'HUI ET DE DEMAIN
Le Journal de Physique Colloques, Vol. 39, Iss. C3, 1978-06 ,pp. :






Revue de Physique Appliquée (Paris), Vol. 10, Iss. 3, 1975-05 ,pp. :