Characterization of inhomogeneous weakly absorbing thin films by photothermal deflection spectroscopy, applications to hydrogenated amorphous silicon films

Publisher： Edp Sciences

E-ISSN： 1764-7177|04|C7|C7-121-C7-124

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.04, Iss.C7, 1994-07, pp. : C7-121-C7-124

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