Nanometric Si/C/N Powders : EXAFS Study at the Silicon K Edge

E-ISSN： 1764-7177|7|C2|C2-1017-C2-1018

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.7, Iss.C2, 1997-04, pp. : C2-1017-C2-1018

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