XEOL Studies of Porous Silicon

Publisher： Edp Sciences

E-ISSN： 1764-7177|7|C2|C2-553-C2-555

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.7, Iss.C2, 1997-04, pp. : C2-553-C2-555

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

XANES and XEOL studies of Eu-doped calcium tungstate in silica synthesized by sol-gel method

By  

Journal of Physics: Conference Series , Vol. 190, Iss. 1, 2009-11 ,pp. : 473-476

IOP Publishing

Access to resources Recommend Favorite

Diffusion in porous silicon carbide

By Pankratov E.  

Physics of the Solid State, Vol. 53, Iss. 5, 2011-05 ,pp. : 943-949

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Optical properties of porous silicon

By Strashnikova M.   Voznyi V.   Reznichenko V.   Gaivoronskii V.  

Journal of Experimental and Theoretical Physics, Vol. 93, Iss. 2, 2001-08 ,pp. : 363-371

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Instability of the photoluminescence of porous silicon

By Orlov A.   Sindyaev A.  

Technical Physics, Vol. 44, Iss. 6, 1999-06 ,pp. : 729-731

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Birefringence of porous silicon

By Sarbey O.   Frolova E.   Fedorovich R.   Dan’ko D.  

Physics of the Solid State, Vol. 42, Iss. 7, 2000-07 ,pp. : 1240-1241

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite