Evolution of Interface Structure in Ni-C Multilayers Depending on Annealing Temperature : Use of Embedded Co Sublayers-Markers

Publisher： Edp Sciences

E-ISSN： 1764-7177|7|C2|C2-699-C2-700

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.7, Iss.C2, 1997-04, pp. : C2-699-C2-700

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