Comparison between Electron Yield, PSD Ion Yield, and Surface PipicoYield in Near C and O K-Edge XAFS in Condensed Methyl Formate-D

Publisher： Edp Sciences

E-ISSN： 1764-7177|7|C2|C2-505-C2-506

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.7, Iss.C2, 1997-04, pp. : C2-505-C2-506

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