An automatic method of measuring the cristallographic orientations of Fe-Si alloys using electron scan microscope image processing and etch pitting

Publisher： Edp Sciences

E-ISSN： 1764-7177|08|PR2|Pr2-677-Pr2-680

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.08, Iss.PR2, 1998-06, pp. : Pr2-677-Pr2-680

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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