Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction

E-ISSN： 1764-7177|11|PR2|Pr2-473-Pr2-477

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.11, Iss.PR2, 2001-07, pp. : Pr2-473-Pr2-477

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