Publisher： Edp Sciences
E-ISSN： 1764-7177|12|6|255-264
ISSN： 1155-4339
Source： Le Journal de Physique IV, Vol.12, Iss.6, 2002-07, pp. : 255-264
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Micellar structure from comparison of X-ray and neutron small-angle scattering
Journal de Physique, Vol. 46, Iss. 2, 1985-02 ,pp. :
Access to resources
Recommend
Data analysis for X-ray fluorescence imaging
Le Journal de Physique IV, Vol. 104, Iss. issue, 2003-03 ,pp. :
Cluster analysis of soft X-ray spectromicroscopy data
Le Journal de Physique IV, Vol. 104, Iss. issue, 2003-03 ,pp. :
X-ray reflectivity measurements on Cd-arachidat films
Le Journal de Physique IV, Vol. 03, Iss. C8, 1993-12 ,pp. :
X-ray reflectivity of classical smectic-A liquid crystals
Journal de Physique, Vol. 49, Iss. 2, 1988-02 ,pp. :