Surface photovoltaic effect in silicon and its application to the measurement of the lifetime of minority carriers.
Publisher: Edp Sciences
E-ISSN: 0368-3842|21|7|575-578
ISSN: 0368-3842
Source: Journal de Physique et le Radium, Vol.21, Iss.7, 1960-07, pp. : 575-578
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