General physical studies on semiconductors using a scanning electron microscope

E-ISSN： 0035-1687|9|2|347-353

ISSN： 0035-1687

Source： Revue de Physique Appliquée (Paris), Vol.9, Iss.2, 1974-03, pp. : 347-353

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

HIGH RESOLUTION ELECTRON BEAM INJECTION IN SEMICONDUCTORS USING A SCANNING TUNNELING MICROSCOPE

Le Journal de Physique IV, Vol. 01, Iss. C6, 1991-12 ,pp. : C6-271-C6-275

Edp Sciences

Access to resources Recommend Favorite

Resolution and Metallurgical Studies with a Scanning Electron Acoustic Microscope

By Richey C. A. Curtis G. J.

Acta Acustica united with Acustica, Vol. 79, Iss. 2, 1993-09 ,pp. : 175-180

S. Hirzel Verlag

Access to resources Recommend Favorite

Cathodoluminescence studies of phosphors in a scanning electron microscope

Journal of Physics: Conference Series , Vol. 619, Iss. 1, 2015-06 ,pp. : 216-219

IOP Publishing

Access to resources Recommend Favorite

STEM electron tomography in the Scanning Electron Microscope

Journal of Physics: Conference Series , Vol. 644, Iss. 1, 2015-10 ,pp. : 47-50

IOP Publishing

Access to resources Recommend Favorite

Analysis of the spatial orientation distribution of building blocks in polycrystals as determined using transmission electron microscopy and a backscattered electron beam in a scanning electron microscope

By Mironov S. Danilenko V. Myshlyaev M. Korneva A.

Physics of the Solid State, Vol. 47, Iss. 7, 2005-07 ,pp. : 1258-1266

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite