Electroréflexion et ellipsométrie spectroscopique d'hétérostructures InGaAsP/InP et GaAlAs/GaAs

E-ISSN： 0035-1687|18|11|709-717

ISSN： 0035-1687

Source： Revue de Physique Appliquée (Paris), Vol.18, Iss.11, 1983-11, pp. : 709-717

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