Publisher: Edp Sciences
E-ISSN: 0035-1687|13|12|787-790
ISSN: 0035-1687
Source: Revue de Physique Appliquée (Paris), Vol.13, Iss.12, 1978-12, pp. : 787-790
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Characterization of materials and structures by the photothermal method
Le Journal de Physique IV, Vol. 04, Iss. C7, 1994-07 ,pp. :
2D chemical characterization of complex semiconductor structures
Journal of Physics: Conference Series , Vol. 326, Iss. 1, 2011-11 ,pp. :
POLYTOPES AND PROJECTION METHOD : AN APPROACH TO COMPLEX STRUCTURES
Le Journal de Physique Colloques, Vol. 47, Iss. C3, 1986-07 ,pp. :