X-ray escape peak variations in diodes made from doubly travelling solvent grown p-type CdTe

Publisher: Edp Sciences

E-ISSN: 0035-1687|12|2|293-296

ISSN: 0035-1687

Source: Revue de Physique Appliquée (Paris), Vol.12, Iss.2, 1977-02, pp. : 293-296

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next