Réflectométrie appliquée aux interfaces diffuses : possibilités et limites de la technique

Publisher: Edp Sciences

E-ISSN: 0035-1687|20|9|631-640

ISSN: 0035-1687

Source: Revue de Physique Appliquée (Paris), Vol.20, Iss.9, 1985-09, pp. : 631-640

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