Photoelectrochemical measurement of effective diffusion length of carriers in lamellar semiconductors. Application to InSe

Publisher： Edp Sciences

E-ISSN： 0035-1687|23|8|1375-1382

ISSN： 0035-1687

Source： Revue de Physique Appliquée (Paris), Vol.23, Iss.8, 1988-08, pp. : 1375-1382

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