Tomographie de diffraction et synthèse de Fourier à maximum d'entropie

Publisher: Edp Sciences

E-ISSN: 0035-1687|22|2|153-167

ISSN: 0035-1687

Source: Revue de Physique Appliquée (Paris), Vol.22, Iss.2, 1987-02, pp. : 153-167

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