THE INTENSITY ENHANCEMENT OF X-RAYS REFLECTED BY AN ANALYZING CRYSTAL MADE OF A THIN FILM

Publisher: Edp Sciences

E-ISSN: 0449-1947|45|C2|C2-189-C2-192

ISSN: 0449-1947

Source: Le Journal de Physique Colloques, Vol.45, Iss.C2, 1984-02, pp. : C2-189-C2-192

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next