THE COMPLEMENTARY USE OF ATOM PROBE FIELD ION MICROSCOPY AND ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY FOR THE STUDY OF A Ni-BASE SUPERALLOY

Publisher: Edp Sciences

E-ISSN: 0449-1947|45|C9|C9-373-C9-378

ISSN: 0449-1947

Source: Le Journal de Physique Colloques, Vol.45, Iss.C9, 1984-12, pp. : C9-373-C9-378

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