MINORITY CARRIER LIFETIME AND POTENTIAL BARRIER HEIGHT IN POLYCRYSTALLINE SILICON : EFFECTS OF LOW TEMPERATURE ANNEALINGS AND NEUTRON IRRADIATION

Publisher： Edp Sciences

E-ISSN： 0449-1947|43|C1|C1-95-C1-101

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.43, Iss.C1, 1982-10, pp. : C1-95-C1-101

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