NONLINEARITY OF THIN-FILM SEMICONDUCTOR INTERFEROMETERS DUE TO INTERLAYER BOUNDARY PHOTOEMF AND ELECTROOPTIC PROCESSES

E-ISSN： 0449-1947|49|C2|C2-87-C2-90

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.49, Iss.C2, 1988-06, pp. : C2-87-C2-90

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