A COMPUTER CONTROLLED SCANNING PROBE-HOLE FIELD EMISSION MICROSCOPE

Publisher： Edp Sciences

E-ISSN： 0449-1947|49|C6|C6-43-C6-48

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.49, Iss.C6, 1988-11, pp. : C6-43-C6-48

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

THE COMPUTER-CONTROLLED FIELD ION MICROSCOPE WITH ATOM-PROBE AT THE HAHN-MEITNER-INSTITUTE

By  

Le Journal de Physique Colloques, Vol. 45, Iss. C9, 1984-12 ,pp. : C9-309-C9-313

Edp Sciences

Access to resources Recommend Favorite

Near-field scanning microscope with carbon nanotube probe

By Kolerov A.  

Technical Physics Letters, Vol. 37, Iss. 3, 2011-03 ,pp. : 259-261

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

FIELD ION MICROSCOPE AND ATOM-PROBE STUDIES OF SCANNING TUNNELING MICROSCOPE TIPS

By  

Le Journal de Physique Colloques, Vol. 49, Iss. C6, 1988-11 ,pp. : C6-55-C6-59

Edp Sciences

Access to resources Recommend Favorite

“Nanotube”: Scanning microscope probe as a controlled source of microwave radiation

By Dedkov G.   Kyasov A.  

Technical Physics Letters, Vol. 31, Iss. 6, 2005-06 ,pp. : 464-467

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Scanning probe microscope dimensional metrology at NIST

By Kramar John A   Dixson Ronald   Orji Ndubuisi G  

Measurement Science and Technology, Vol. 22, Iss. 2, 2011-02 ,pp. : 24001-24011

IOP Publishing

Access to resources Recommend Favorite