INVESTIGATION OF BURRIED INTERFACE (Si3N4/Ga As) BY EXAFS IN TOTAL REFLECTION AND DISPERSIVE MODE

Publisher： Edp Sciences

E-ISSN： 0449-1947|47|C8|C8-415-C8-418

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.47, Iss.C8, 1986-12, pp. : C8-415-C8-418

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