EFFECTS OF A GOLD SHANK-OVERLAYER ON THE FIELD ION IMAGING OF SILICON

Publisher： Edp Sciences

E-ISSN： 0449-1947|47|C7|C7-333-C7-336

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.47, Iss.C7, 1986-11, pp. : C7-333-C7-336

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

FIELD-ION ENERGY SPECTROSCOPY OF GOLD OVERLAYERS ON SILICON

By  

Le Journal de Physique Colloques, Vol. 48, Iss. C6, 1987-11 ,pp. : C6-461-C6-461

Edp Sciences

Access to resources Recommend Favorite

NEGATIVE ION IMAGING IN FIELD ION MICROSCOPY

By  

Le Journal de Physique Colloques, Vol. 47, Iss. C7, 1986-11 ,pp. : C7-53-C7-57

Edp Sciences

Access to resources Recommend Favorite

FIELD ION APPEARANCE SPECTROSCOPY AT SILICON SURFACES

By  

Le Journal de Physique Colloques, Vol. 47, Iss. C2, 1986-03 ,pp. : C2-157-C2-165

Edp Sciences

Access to resources Recommend Favorite

FIELD ION APPEARANCE SPECTROSCOPY AT SILICON SURFACES

By  

Le Journal de Physique Colloques, Vol. 45, Iss. C9, 1984-12 ,pp. : C9-263-C6-264

Edp Sciences

Access to resources Recommend Favorite

COMPUTERIZED IMAGING SYSTEM FOR FIELD ION MICROSCOPY

By  

Le Journal de Physique Colloques, Vol. 47, Iss. C2, 1986-03 ,pp. : C2-479-C2-484

Edp Sciences

Access to resources Recommend Favorite