![Open access](/images/ico/o.png)
![](/images/ico/ico5.png)
Author: Pisarenko Ivan Ryndin Eugeny
Publisher: MDPI
E-ISSN: 2079-9292|5|3|52-52
ISSN: 2079-9292
Source: Electronics, Vol.5, Iss.3, 2016-09, pp. : 52-52
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/o.png)
![](/images/ico/ico5.png)
Analysis of Deep Level Defects in GaN p-i-n Diodes after Beta Particle Irradiation
By Belahsene Sofiane Al Saqri Noor alhuda Jameel Dler Mesli Abdelmadjid Martinez Anthony de Sanoit Jacques Ougazzaden Abdallah Salvestrini Jean Paul Ramdane Abderrahim Henini Mohamed
Electronics, Vol. 4, Iss. 4, 2015-12 ,pp. :
![](/images/ico/o.png)
![](/images/ico/ico5.png)
![](/images/ico/o.png)
![](/images/ico/ico5.png)
![](/images/ico/o.png)
![](/images/ico/ico5.png)
Turbulence: Numerical Analysis, Modeling, and Simulation
Fluids, Vol. 3, Iss. 1, 2018-02 ,pp. :