

Author: Hasler Jennifer Shah Sahil Kim Sihwan Lal Ishan Kumal Collins Michelle
Publisher: MDPI
E-ISSN: 2079-9268|6|3|14-14
ISSN: 2079-9268
Source: Journal of Low Power Electronics and Applications, Vol.6, Iss.3, 2016-07, pp. : 14-14
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Abstract
We present a novel remote test system, an integrated remote testing system requiring minimal technology support overhead, enabled by configurable analog–digital Integrated Circuits (IC) to create a simple interface for a wide range of experiments. Our remote test system requires no additional setup, resulting both from using highly configurable devices, as well as from the advancement of straight-forward digital interfaces (i.e., USB) for the resulting experimental system. The system overhead requirements require simple email handling, available over almost all network systems with no additional requirements. The system is empowered through large-scale Field Programmable Analog Array (FPAA) devices and Baseline Tool Framework (BTF), where we present a range of experimentally measured examples illustrating the range of user interfacing available for the remote user.
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