Fast Industrial Inspection of Optical Thin Film Using Optical Coherence Tomography

Author： Shirazi Muhammad Faizan   Park Kibeom   Wijesinghe Ruchire Eranga   Jeong Hyosang   Han Sangyeob   Kim Pilun   Jeon Mansik   Kim Jeehyun  

Publisher： MDPI

E-ISSN： 1424-8220|16|10|1598-1598

ISSN： 1424-8220

Source： Sensors, Vol.16, Iss.10, 2016-09, pp. : 1598-1598

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