Charge Trapping by Self‐Assembled Monolayers as the Origin of the Threshold Voltage Shift in Organic Field‐Effect Transistors

Publisher： John Wiley & Sons Inc

E-ISSN： 1613-6829|8|2|241-245

ISSN： 1613-6810

Source： SMALL, Vol.8, Iss.2, 2012-01, pp. : 241-245

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