Analysis of Interface Trap Densities for Al2O3 Dielectric Material Based Ultra Thin MOS Devices

Publisher: Trans Tech Publications

E-ISSN: 1662-7482|2016|860|25-29

ISSN: 1660-9336

Source: Applied Mechanics and Materials, Vol.2016, Iss.860, 2017-02, pp. : 25-29

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Abstract