Author: Dauxois Jean-Yves Flesch Alexis Varron Davit
Publisher: Edp Sciences
E-ISSN: 1262-3318|20|issue|66-94
ISSN: 1292-8100
Source: ESAIM: Probability and Statistics, Vol.20, Iss.issue, 2016-07, pp. : 66-94
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Abstract
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