Dynamic scanning force microscopy at low temperatures on a noble-gas crystal: Atomic resolution on the xenon(111) surface

Publisher: Edp Sciences

E-ISSN: 1286-4854|48|3|276-279

ISSN: 0295-5075

Source: EPL (EUROPHYSICS LETTERS), Vol.48, Iss.3, 1999-11, pp. : 276-279

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next