Author: Rousseau M. Rodallec A. Bonnaud S. Paris F. Corre I.
Publisher: Edp Sciences
E-ISSN: 1769-700x|43|5|111-111
ISSN: 0033-8451
Source: Radioprotection, Vol.43, Iss.5, 2008-09, pp. : 111-111
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Thick oxide MOS transistors for ionizing radiation dose measurement
By SARRABAYROUSE G. GESSINN F.
Radioprotection, Vol. 29, Iss. 4, 2010-03 ,pp. :
By Sorokina S. Zaichkina S. Rozanova O. Aptikaeva G. Akhmadieva A. Smirnova E. Romanchenko S. Vachrucheva O. Dukina A.
Radioprotection, Vol. 43, Iss. 5, 2008-09 ,pp. :