Thick oxide MOS transistors for ionizing radiation dose measurement

Author: SARRABAYROUSE G.   GESSINN F.  

Publisher: Edp Sciences

E-ISSN: 1769-700x|29|4|557-572

ISSN: 0033-8451

Source: Radioprotection, Vol.29, Iss.4, 2010-03, pp. : 557-572

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Abstract