Publisher： Edp Sciences
E-ISSN： 1764-7177|104|issue|463-466
ISSN： 1155-4339
Source： Le Journal de Physique IV, Vol.104, Iss.issue, 2003-03, pp. : 463-466
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Le Journal de Physique IV, Vol. 104, Iss. issue, 2003-03 ,pp. :
Access to resources
Recommend
PHOTOELECTRON X-RAY MICROSCOPY
Le Journal de Physique Colloques, Vol. 45, Iss. C2, 1984-02 ,pp. :
Borman effect in resonant diffraction of X-rays
By Oreshko A.
Journal of Experimental and Theoretical Physics, Vol. 117, Iss. 2, 2013-08 ,pp. :
By Chul Choi H. Kyu Lee M. Joon Shin H. Bin Kim S.
Journal of Electron Spectroscopy and Related Phenomena, Vol. 130, Iss. 1, 2003-07 ,pp. :
TOTAL RATE IMAGING WITH X-RAYS IN A SCANNING ELECTRON MICROSCOPE
Le Journal de Physique Colloques, Vol. 45, Iss. C2, 1984-02 ,pp. :