Publisher: Edp Sciences
E-ISSN: 1764-7177|104|issue|483-486
ISSN: 1155-4339
Source: Le Journal de Physique IV, Vol.104, Iss.issue, 2003-03, pp. : 483-486
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
The nuclear microprobe as a complementary technique to X-raymicroscopy
Le Journal de Physique IV, Vol. 104, Iss. issue, 2003-03 ,pp. :
Techniques for characterization of fractal clusters using X-raymicroscopy
Le Journal de Physique IV, Vol. 104, Iss. issue, 2003-03 ,pp. :
Analysis of interplanetary dust particles by soft and hard X-raymicroscopy
Le Journal de Physique IV, Vol. 104, Iss. issue, 2003-03 ,pp. :
MnxGe1-x dilute magnetic semiconductor studied by XAFS
Journal of Physics: Conference Series , Vol. 190, Iss. 1, 2009-11 ,pp. :