Publisher: Edp Sciences
E-ISSN: 1764-7177|104|issue|223-226
ISSN: 1155-4339
Source: Le Journal de Physique IV, Vol.104, Iss.issue, 2003-03, pp. : 223-226
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Germanium and silicon kinoform focusing lenses for hard x-rays
Journal of Physics: Conference Series , Vol. 186, Iss. 1, 2009-09 ,pp. :
Observation of dislocations in silicon using the anomalous transmission of X-rays.
Journal de Physique et le Radium, Vol. 21, Iss. 8-9, 1960-08 ,pp. :
Nano-tomography based on hard X-ray microscopy with refractivelenses
Le Journal de Physique IV, Vol. 104, Iss. issue, 2003-03 ,pp. :
Elastic scattering of linearly polarized hard x-rays
Journal of Physics: Conference Series , Vol. 635, Iss. 9, 2015-09 ,pp. :
Long-term variability of AGN at hard X-rays
By Soldi S. Beckmann V. Baumgartner W. H. Ponti G. Shrader C. R. Lubiński P. Krimm H. A. Mattana F. Tueller J.
Astronomy & Astrophysics, Vol. 563, Iss. issue, 2014-03 ,pp. :