Sensing thermal conductivity and structural effects at the nanoscale by scanning thermal microscopy (SThM)

Publisher: Edp Sciences

E-ISSN: 1764-7177|137|issue|265-271

ISSN: 1155-4339

Source: Le Journal de Physique IV, Vol.137, Iss.issue, 2006-11, pp. : 265-271

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next