Valence charges for ultrathin SiO$_{2}$ films formed onSi(100)

Publisher: Edp Sciences

E-ISSN: 1764-7177|132|issue|83-86

ISSN: 1155-4339

Source: Le Journal de Physique IV, Vol.132, Iss.issue, 2006-03, pp. : 83-86

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next