Determination of thickness and porosity of porous silicon layer using photoacoustic technique

Publisher: Edp Sciences

E-ISSN: 1764-7177|125|issue|301-304

ISSN: 1155-4339

Source: Le Journal de Physique IV, Vol.125, Iss.issue, 2005-06, pp. : 301-304

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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