Electron scattering by gas in the Environmental Scanning Electron Microscope (ESEM): Effects on the image quality and on the X-ray microanalysis

Publisher： Edp Sciences

E-ISSN： 1764-7177|118|1|237-243

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.118, Iss.1, 2004-11, pp. : 237-243

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