Effects of interface roughness on the local valence electronicstructure at the SiO$_{2}$/Si interface: Soft X-ray absorptionand emission study

Publisher： Edp Sciences

E-ISSN： 1764-7177|132|issue|259-262

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.132, Iss.issue, 2006-03, pp. : 259-262

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