Characterization of D-Tcryogenic layer formation in a Beryllium capsule using X-ray phasecontrast imaging

E-ISSN： 1764-7177|133|issue|869-873

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.133, Iss.issue, 2006-06, pp. : 869-873

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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