X-Ray diffraction and Raman spectroscopy for a better understanding of ZnO:Al growth process

Author： Charpentier C. Prod’homme P. Maurin I. Chaigneau M. Roca i Cabarrocas P.

E-ISSN： 2105-0716|2|issue|25002-25002

ISSN： 2105-0716

Source： EPJ Photovoltaics, Vol.2, Iss.issue, 2012-01, pp. : 25002-25002

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