Non-contact wafer thickness measurement of capacitance sensor circuit based on CAV424

E-ISSN： 2261-236x|44|issue|02057-02057

ISSN： 2261-236x

Source： MATEC Web of conference, Vol.44, Iss.issue, 2016-03, pp. : 02057-02057

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Study of Non-contact Voltage Detector of 1000kV UHV AC Based on MEMS Electric Field Sensor

MATEC Web of conference, Vol. 160, Iss. issue, 2018-04 ,pp. : 02001-02001

Edp Sciences

Access to resources Recommend Favorite

Errors in non-contact sensor measurements due to misalignment and scanning methodology

By Warlick Zachary Katz Reuven

International Journal of Metrology and Quality Engineering, Vol. 6, Iss. 3, 2015-10 ,pp. : 305-305

Edp Sciences

Access to resources Recommend Favorite

Non-Contact Measurement of Cereal Quality by Image Sensing and Numerical Regression Techniques

MATEC Web of conference, Vol. 75, Iss. issue, 2016-09 ,pp. : 01002-01002

Edp Sciences

Access to resources Recommend Favorite

Development of coaxial speaker-like non-contact electrostatic sensor for aviation engine exhaust electrostatic character research

MATEC Web of conference, Vol. 31, Iss. issue, 2015-11 ,pp. : 07004-07004

Edp Sciences

Access to resources Recommend Favorite

Method of detecting number of cloths using sound (non-contact measurement by using acoustic characteristic of cloths)

By Sakamoto Shuichi Ichimiya Ryoichi Yanagimoto Kensaku Sato Taiki

INTER-NOISE and NOISE-CON Congress and Conference Proceedings, Vol. 2001, Iss. 6, 2001-08 ,pp. : 690-693

Institute of Noise Control Engineering

Access to resources Recommend Favorite