Random thresholds for linear model selection

Author: Lavielle Marc   Ludeña Carenne  

Publisher: Edp Sciences

E-ISSN: 1262-3318|12|issue|173-195

ISSN: 1292-8100

Source: ESAIM: Probability and Statistics, Vol.12, Iss.issue, 2008-01, pp. : 173-195

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Abstract